The 64th JSAP Spring Meeting 2017
Session ID : 15a-513-7
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 64
Location : [in Japanese]
Date : March 14, 2017 - March 17, 2017
Cathodoluminescence Characterization of Mix and Edge Dislocations in etched GaN
Keywords:
15a-513-7,
Semiconductor English Session,
Optical properties and light-emitting devices,
Semiconductor,
GaN,
Dislocation
Details
Article 1st page
