JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 78th JSAP Autumn Meeting 2017
Session ID : 8a-PB4-8
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Spectroscopic in-situ Measurements during SiO:CH Deposition by ICP-CVD
*masato seitouToshiki HiraiTakumi AiharaYasusi InoueOsamu Takai
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Keywords: 8a-PB4-8, Thin film, Plasma
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© 2017 The Japan Society of Applied Physics
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