The 78th JSAP Autumn Meeting 2017
Session ID : 7a-A203-8
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Autumn Meeting
Number : 78
Location : [in Japanese]
Date : September 05, 2017 - September 08, 2017
Degradation process of C60 field-effect transistor observed by three terminal displacement current measurement
Details
Article 1st page
