The 78th JSAP Autumn Meeting 2017
Session ID : 5p-PA3-5
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Autumn Meeting
Number : 78
Location : [in Japanese]
Date : September 05, 2017 - September 08, 2017
Accumulated Charge Measurement at the Metal/Organic Semiconductor Interface:The Effect of Offset Bias Voltages
*Yuta Miyamoto, Keisuke Yoshida, Tomofumi Kadoya, Seiichi Sato, Junichi Yamada, Hiroyuki Tajima
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