JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 65th JSAP Spring Meeting 2018
Session ID : 19a-C101-4
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Evaluation of Minority Carrier Lifetime in FZ-Si Affected by Si-IGBT Process
*Hiroto KobayashiRyo YokogawaTakahiro SuzukiYoichiro NumazawaAtsushi OguraShin-ichi NishizawaTakuya SarayaKazuo ItoToshihiko TakakuraShin-ichi SuzukiMunetoshi FukuiKiyoshi TakeuchiToshiro Hiramoto
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© 2018 The Japan Society of Applied Physics
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