JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 65th JSAP Spring Meeting 2018
Session ID : 17p-P8-22
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High Reliability Techniques of 3D-NAND Flash Memories by Lateral Charge Migration Suppression
*Kyoji MizoguchiShohei KotakiYoshiaki DeguchiKen Takeuchi
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© 2018 The Japan Society of Applied Physics
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