JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 65th JSAP Spring Meeting 2018
Session ID : 19p-C302-4
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Threshold voltage shift in vertical trench GaN-MOSFETs by negative gate-bias stress
*Masataka SasadaNorihumi TakashimaShoichi MurataJoel AsubarHirokuni TokudaKatsunori UenoMasaharu EdoMasaaki Kuzuhara
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© 2018 The Japan Society of Applied Physics
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