The 65th JSAP Spring Meeting 2018
Session ID : 20a-F202-1
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 65
Location : [in Japanese]
Date : March 17, 2018 - March 20, 2018
Attempt to Detect Micro Scratch on Surface of SiC Substrate Using Stress Induced Light Scattering Method
Details
Article 1st page
