JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 79th JSAP Autumn Meeting 2018
Session ID : 21p-PB3-5
Conference information

Charge Trapping and Hysteresis Behavior in ReS2/SiO2 and ReS2/hBN Field Effect Transistors
*Amir ZulkefliBablu MukherjeeKenji WatanabeTakashi TaniguchiYutaka WakayamaShu Nakaharai
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Article 1st page
Content from these authors
© 2018 The Japan Society of Applied Physics
Previous article Next article
feedback
Top