JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 79th JSAP Autumn Meeting 2018
Session ID : 19p-CE-10
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Evaluation of Electrical Properties of SiO2/p-GaN MOS Capacitors
*Takahiro YamadaDaiki TerashimaMikito NozakiHisashi YamadaTokio TakahashiMitsuaki ShimizuTakuji HosoiTakayoshi ShimuraHeiji Watanabe
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© 2018 The Japan Society of Applied Physics
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