JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 79th JSAP Autumn Meeting 2018
Session ID : 20p-136-1
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HAXPES measurements of GaAs thin film//ITO interfaces for GaAs//ITO/Si junctions.
*Tomoya HaraJianbo LiangKenji ArakiTakefumi KamiokaHassanet SodabanluKentaro WatanabeMasakazu SugiyamaNaoteru Shigekawa
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© 2018 The Japan Society of Applied Physics
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