JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 66th JSAP Spring Meeting 2019
Session ID : 11p-S423-14
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Depairing Current Density Measurements of micro-bridge devices made of FeTexSe1-x Single Crystals
Haruka OhnumaYue SunNaoki MineTakashi NojiYoji KoikeTsuyoshi TamegaiShin-ya Ayukawa*Haruhisa Kitano
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© 2019 The Japan Society of Applied Physics
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