The 66th JSAP Spring Meeting 2019
Session ID : 9a-M121-1
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 66
Location : [in Japanese]
Date : March 09, 2019 - March 12, 2019
Transient photo-assisted capacitance characterization of deep states at insulator/wide-bandgap semiconductor interface
Details
Article 1st page
