JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 80th JSAP Autumn Meeting 2019
Session ID : 20a-E215-2
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Investigation of bonding strength between (InP, Si)/SiO2 and Si by Surface Activated Bonding based on Fast Atom Beam assisted by Si nano-film
*Weicheng FangYuning WangTomohiro AmemiyaNobuhiko Nishiyama
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© 2019 The Japan Society of Applied Physics
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