The 80th JSAP Autumn Meeting 2019
Session ID : 18p-PA5-20
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Autumn Meeting
Number : 80
Location : [in Japanese]
Date : September 18, 2019 - September 21, 2019
Thermoelectric characterization of heavily impurity doped epitaxial NiO(111) thin films grown by room temperature PLD.
*Yoshiharu Shinozaki, Subaru Nakanishi, Satoru Kaneko, Yoshisato Kimura, Akifumi Matsuda, Mamoru Yoshimoto
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