The 80th JSAP Autumn Meeting 2019
Session ID : 20p-E301-7
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Autumn Meeting
Number : 80
Location : [in Japanese]
Date : September 18, 2019 - September 21, 2019
Two-dimensional characterization of etched GaN surfaces using scanning internal photoemission microscopy
Details
Article 1st page
