JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 80th JSAP Autumn Meeting 2019
Session ID : 20p-E317-3
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Investigation of Deterioration of Pt Nanogap Memory Device and Influence of Electrode Under Extremely High Temperature Environment
*Kazuki OtsuHiroshi SugaKazuhito TsukagoshiYasuhisa Naitoh
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Keywords: 20p-E317-3, nanogap
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© 2019 The Japan Society of Applied Physics
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