JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 67th JSAP Spring Meeting 2020
Session ID : 14p-PB2-7
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Effects of an electron blocking layer on the dark current reduction in the carrier multiplication-type c-Se-stacked 8K CMOS image sensors
*Shigeyuki ImuraKeitada MineoToshiki AraiToshihisa WatabeKazunori MiyakawaMisao KubotaKeisuke NishimotoMutsumi SugiyamaMasakazu Nanba
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© 2020 The Japan Society of Applied Physics
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