JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 67th JSAP Spring Meeting 2020
Session ID : 14a-D305-5
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Improvement of Secondary Ion Yield with Electrospray Ion Source
*Taiki MatsudaToshio SekiTakaaki AokiJiro Matsuo
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Keywords: 14a-D305-5, SIMS, ESI, Cluster
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© 2020 The Japan Society of Applied Physics
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