JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 67th JSAP Spring Meeting 2020
Session ID : 12p-A205-13
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Prediction Scheme for Long-Term Electrical Reliability of Plasma-Damaged SiO2 Films Based on the Percolation Theory
*Takashi HamanoKeiichiro UrabeKoji Eriguchi
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© 2020 The Japan Society of Applied Physics
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