JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 67th JSAP Spring Meeting 2020
Session ID : 13a-B401-3
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Influence of SiO2 and HfO2 initial growth layer on electrical properties
*Erika MaedaToshihide NabatameMasafumi HiroseMari InoueAkihiko OhiNaoki IkedaKoji ShiozakiHajime Kiyono
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© 2020 The Japan Society of Applied Physics
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