JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 67th JSAP Spring Meeting 2020
Session ID : 12p-A401-4
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Understanding the operation of 2D memory device by measuring floating gate voltage
*Taro SasakiTakashi TaniguchiKenji WatanabeTomoki NishimuraKosuke Nagashio
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© 2020 The Japan Society of Applied Physics
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