JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 81st JSAP Autumn Meeting 2020
Session ID : 10p-Z23-6
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Rate and profile optimization of 4H-SiC wafer etching using ClF3 gas
Kenta IrikuraMasaya Hayashi*Hitoshi HabukaYoshinao TakahashiTomohisa Kato
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© 2020 The Japan Society of Applied Physics
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