The 81st JSAP Autumn Meeting 2020
Session ID : 10p-Z23-9
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Autumn Meeting
Number : 81
Location : [in Japanese]
Date : September 08, 2020 - September 11, 2020
Influence of basal-plane dislocation structures on expansion of single Shockley-type stacking faults in forward-current degradation of 4H-SiC p–i–n diodes
*Shohei Hayashi, Tamotsu Yamashita, Junji Senzaki, Masaki Miyazato, Mina Ryo, Masaaki Miyajima, Tomohisa Kato, Yoshiyuki Yonezawa, Kazutoshi Kojima, Hajime Okumura
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