JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 81st JSAP Autumn Meeting 2020
Session ID : 8a-Z14-10
Conference information

Comparison of Gate Bias Characteristics of MOSFETs at High TID
*Ryoichiro YoshidaArisa KimuraMotoki AndoYuta OshimaShinsuke NabeyaKenji HirakawaMasayuki IwaseMunehiro OgasawaraTakashi YodaNoboru IshiharaHiroyuki Ito
Author information
CONFERENCE PROCEEDINGS FREE ACCESS

Details
Article 1st page
Content from these authors
© 2020 The Japan Society of Applied Physics
Previous article Next article
feedback
Top