The 69th JSAP Spring Meeting 2022
Session ID : 23p-E302-14
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 69
Location : [in Japanese]
Date : March 22, 2022 - March 26, 2022
Two-dimensional characterization of electric fields in n-GaN Schottky contacts under applied voltage by scanning internal photoemission microscopy
*Yuto Yasui, Fumimasa Horikiri, Yoshinobu Narita, Noboru Fukuhara, Tomoyoshi Mishima, Hiroki Imabayashi, Kenji Shiojima
Author information
Keywords:
23p-E302-14,
Schottky contacts,
scanning internal photoemission microscopy method,
two-dimensional electric field characterization
Details
Article 1st page
