JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 69th JSAP Spring Meeting 2022
Session ID : 24p-E302-3
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Formation of high-quality SiC/SiO2 interfaces by suppressing SiC oxidation
*Takuma KobayashiTakafumi OkudaKeita TachikiKoji ItoYu-ichiro MatsushitaTsunenobu Kimoto
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© 2022 The Japan Society of Applied Physics
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