JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 69th JSAP Spring Meeting 2022
Session ID : 24p-E302-15
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Behavior of Vth under Negative High Gate Oxide Electric Field Stress on SiC MOSFETs
*Munetaka NoguchiAkihiro KoyamaToshiaki IwamatsuHiroshi WatanabeNaruhisa Miura
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© 2022 The Japan Society of Applied Physics
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