JSAP Annual Meetings Extended Abstracts
Online ISSN : 2436-7613
The 69th JSAP Spring Meeting 2022
Session ID : 25a-E301-8
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Limited Current in 4H-SiC N-type Epilayer due to Various Types of Stacking Faults
*Satoshi AsadaKoichi MurataHidekazu Tsuchida
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© 2022 The Japan Society of Applied Physics
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