The 69th JSAP Spring Meeting 2022
Session ID : 25a-P06-1
Conference information
Host: The Japan Society of Applied Physics
Name : JSAP Spring Meeting
Number : 69
Location : [in Japanese]
Date : March 22, 2022 - March 26, 2022
High-throughput electronic phase diagram analysis of ternary thin films using photoelectron emission microscopy
Ryosuke Sugita, *Taiki Kasamatsu Kasamatsu, Kaito Kobayashi, Ryohei Seni, Ken Masuzawa, Syunsuke Sato, Mayuko Okada, Alexandre Foggiatto, Takuo Ohkouchi, Masato Kotsugi
Author information
Keywords:
25a-P06-1,
Measurement Informatics
Details
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