Exploring magic equations for soft-error reliability

Abstract

Semiconductor devices are inherently sensitive to radiation, exhibiting malfunctions called soft errors. Although a soft error is sometimes misunderstood as an old and settled issue, it still makes marked negative impacts on our social and economic activities. Today’s testing of soft-error reliability relies heavily on exposure to radiation. Regardless of whether an effort aims for space or terrestrial applications, the reliability of a chip is hardly known until tested with radiation. As a soft error is triggered by energy deposition from radiation, the bombardment of radiation seems essential and unavoidable in the test—Is it really true? The present study is challenging this question. The authors are exploring equations capable of assessing soft-error reliability proactively—as if by magic—without using radiation.