ペルチェ素子を用いた形状記憶変形挙動の高速測定
1992 年 4 巻 3 号 p. 210-213
詳細
1992 年 4 巻 3 号 p. 210-213
The fatigue test device of Shape Memory Alloy wire was developed using the Peltier element of Bi2Te3 and Sb2Te3 for p type and Bi3Te3 and Sb2Se3 for n type. The measurements of Ti-Ni-Cu wire and rapidly solidified Ti-Ni and Ti-Ni-Cu were carried out by short cycle time of heating and cooling under stable temperature control. From the experiment, it was concluded that the elongation by plastic deformation caused the fatigue and degradation of Shape Memory Alloy.
