太陽エネルギー
Online ISSN : 2433-5592
Print ISSN : 0388-9564
研究論文
熱画像を利用した太陽電池モジュールのバイパスダイオード開放故障判定方法に関する研究
-遮光セルの発熱温度調節方法-
上田 紘巨 山中 三四郎青山 泰宏西戸 雄輝小林 浩
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2020 年 46 巻 5 号 p. 71-78

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An open failure of the bypass diode (BPD) of a photovoltaic module can damage the cell. With existing inspection methods, it is difficult to find an open failure of a BPD. A method for finding open failure of BPDs using thermal imaging was investigated. The following points were clarified in this study. In a partially shaded cell, the unshaded portion of the cell generates heat. There are two types of heating: surface heating and point heating. They occur simultaneously. Point heating causes the back sheet to burn. However, if the shaded area is 10%, the cell does not burn as a result of point heating for a long time. Surface heating can cause the heat generation temperature of the cell surface to become high. The heat generation temperature can be adjusted by setting the number of shaded cells so that multiple cells are shaded. The heat generation temperature of a partially shaded cell differs depending on whether the BPD is open.

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