44　Open Fault Detection of Bypass Circuit of PV Module with IR Camera

―Effect of Applied Voltage Amplitude In The Case of Two Faults―

Abstract

With conventional technology, even if it is possible to discover whether there is an open fault bypass circuit in a string, it is difficult to pinpoint its location. When a voltage is applied in the direction in which the bypass circuit of the PV module operates, the temperature rises in the open fault PV cluster, and this is used to identify the fault position. The purpose of this study is to identify the location of open fault PV cluster. In this paper, we describe the effect of amplitude of the applied voltage across a string to identify the two open fault cluster in a string.