99　Simulation Study of Open Fault Detection technology for PVM and Bypass Circuits

Abstract

With conventional technology, even if it is possible to discover whether there is an open fault bypass circuit in a string, it is difficult to pinpoint its location. When a voltage is applied in the direction in which the bypass circuit of the PV module operates, the temperature rises in the open fault PV cluster, and this is used to identify the fault position. The purpose of this study is to identify the location of open fault PV cluster. In this paper, we report the results of a simulation basic study to investigate the effects of the magnitude of the applied voltage to the string, differences in cluster IV characteristics, and irradiance on fault detection.