高圧力科学におけるIT
粉末X線回折像解析プログラムPIPの進展
2005 年 15 巻 1 号 p. 29-35
詳細
2005 年 15 巻 1 号 p. 29-35
Recent progress in the software PIP is briefly summarized. New algorithms of the divided histogram method and the super sampling method have greatly improved the accuracy for two-dimensional image to one-dimensional profile conversion. The accuracy of peak positions in the one-dimensional pattern has been increased by optimizing their fitting region. Many other issues such as running with a TrueColor mode and porting to other platforms are also introduced.
