2008 年 18 巻 1 号 p. 31-37
In this article, recent advances in X-ray spectroscopy, in particular X-ray Raman scattering (XRS), under high pressure are introduced. There are problems to overcome when these techniques are applied to high-pressure materials science. Solutions for the problems are shown. As examples of XRS study under pressure conditions, experimental results on H2O and SiO2 are reviewed. Further prospect of these techniques on materials of the earth’s interior is discussed.