高圧力下の低温X線回折実験

抄録

  In high-pressure study, the crystal structures of materials are a very important factor at low temperature. X-ray diffraction measurement is the most frequent and useful method techniqe to determine the crystal structure under pressure. In this article, our recent progresses of high-pressure and low-temperature X-ray diffraction system are reviewed. We also describe the recent researches in our laboratory.