The Review of High Pressure Science and Technology
Online ISSN : 1348-1940
Print ISSN : 0917-639X
ISSN-L : 0917-639X
XAFS Studies under Pressure
Yoshinori Katayama
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JOURNAL FREE ACCESS

1995 Volume 4 Issue 1 Pages 42-48

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Abstract
Recent advance in X-ray Absorption Fine Structure (XAFS) study under pressure is reviewed. After a brief introduction to XAFS and its applications to high-pressure studies, recent development of XAFS measurements under pressure at the Photon Factory is presented. We successfully obtained X-ray absorption spectra at pressures up to 10 GPa and temperatures up to 700°C using a multi-anvil type apparatus, MAX90. Results of our studies on crystalline selenium, amorphous selenium and isolated selenium chains are presented.
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© The Japan Society of High Pressure Science and Technology
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