Abstract
Eye-blink activities are major artifacts for electroencephalogram (EEG) measurements. Various methods have been reported for removing eye-blink artifacts from EEGs. Almost all previous methods focus on how much eye-blink artifacts are removed. However, they concurrently remove a part of EEGs together with eye-blink artifacts. Instead, we focus on how much true EEGs remains, and proposed a localized removal method for eye-blink artifacts. The proposed method is based on the combinations of independent component analysis (ICA). empirical mode decomposition (EMD) and Kalman filter. In addition, we proposed a novel simulation model to test performances of the proposed and previous methods. This simulation model indicates that the proposed method shows the best performance and reduces information loss of EEGs than previous methods.
