Measurement of Residual Stress in a Sphere by X-Ray Under the Consideration of its Penetration Depth

抄録

Applying the fundamental formula which has been derived by them from the consideration on a physical phenomenon of contribution of the internal stress in a definite subsurface layer of metal to the X-ray diffraction, the authors propose an exact theory of residual stress measurement for the Front Surface Method by successive thin layer removal in a sphere of a ball bearing by using the characteristic X-ray of Cr.