抄録
This paper covers the recent progress in two-dimensional X-ray diffraction theory and applications in structure and stress analysis. Two-dimensional X-ray diffraction refers to X-ray diffraction applications with two-dimensional detectors and corresponding data reduction and analysis. The two-dimensional X-ray diffraction provides far more information than the conventional one-dimensional diffraction. The structure information, such as grain size and preferred orientation, can be observed directly on the two-dimensional diffraction image. Phase identification can be done by integration over a selected range of diffraction rings. The integrated data gives better intensity and statistics, especially for those samples with texture, large grain size, or small quantity. The two-dimensional detector collects texture data and background values simultaneously for multiple poles and multiple directions. Stress measurement using two-dimensional detector is based on a direct relationship between the stress tensor and the diffraction cone distortion. Since the whole or a part of the Debye ring is used for stress calculation, two-dimensional system can measure stress with high sensitivity, high speed and high accuracy.
