Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics
Online ISSN : 2424-2837
セッションID: OS06W0457
会議情報
OS06W0457 Reduction of electrical resistivity in PdCuSi thin film metallic glass
J. SakuraiS. HataA. Shimokohbe
著者情報
会議録・要旨集 フリー

詳細
抄録
Electrical resistivities of PdCuSi thin film metallic glasses (TFMGs) are investigated as a function of annealing conditions in an attempt to control crystallization of the PdCuSi TFMG in order to reduce electrical resistivity without inducing embrittlement. Glass transition temperature T_g, crystallization temperature T x and electrical resistivity of the as-sputtered Pd_<76>Cu_6Si_<18> TFMG are 638K, 663K and 64μΩcm. Resistivity of Pd _<76>Cu_6Si_<18> TFMG is found to decrease as crystallization proceeds. Although the resistivity of Pd_<76>Cu_6Si_<18> TFMG annealed at 633K (= T_g - 5K) for 60s does not decrease, because the material remains amorphous, the resistivity of Pd_<76>Cu_6Si_<18> TFMG annealed at 633K for 600 s does decrease by a few K, even though the specimen is still amorphous. Stress relaxation of Pd_<76>Cu_6Si_<18> TFMG is thus thought to occur by glass transitions. When annealed at 633 K for over 1200s, Pd_<76>Cu_6Si_<18> TFMG becomes partially crystallized, and electrical resisitivity decreases with increasing annealing time. Pd_<76>Cu_6Si_<18> TFMG annealed at 633K for 2700s becomes completely crystallized, giving an electrical resisitivity of about 30μΩcm. Annealing Pd_<76>Cu_6Si_<18> TFMG at 643K (= T_g + 5K) for 600s also results in complete crystallization. During crystallization of Pd_<76>Cu_6Si_<18> TFMG, γ-(Pd-Cu) and Pd solid solution crystallize first out of the amorphous phase. At this point, Pd_<76>Cu_6Si_<18> TFMG exhibits a sufficiently high strength, with electrical resistance reduced to about 50μΩcm. After further annealing, Pd-silicides, Pd_4Si and Pd_3Si, are formed and Pd_<76>Cu_6Si_<18> TFMG is crystallized completely. Although this gives an electrical resistivity of about 30μΩcm, the specimens become very brittle.
著者関連情報
© 2003 一般社団法人 日本機械学会
前の記事 次の記事
feedback
Top