Abstract
Microstructural changes during annealing on a Al-0.72 Mg-0.38 Si-0.20 Cr alloy were observed in detail using an SEM-EBSD system. After cold-rolling at 75 % reduction, a surface of a specimen was electropolished and EBSD observation was carried out. The specimen was removed from SEM and annealed at 673 K. The surface of the specimen was Ar-ion polished and then the same area was observed with EBSD. Observation, intermittent annealing and ion-polishing were repeated for up to 100 s. Dislocation cells changed into subgrains by annealing and grew to form recrystallized grains. Orientations of the dislocation cell and the recrystallized grain are about the same. The origins for recrystallized grains pre-exist in deformed microstructures.
