計算力学講演会講演論文集
Online ISSN : 2424-2799
セッションID: 237
会議情報
237 試験片表面に貼付したピエゾ薄膜の計測結果を用いた受動型電気ポテンシャルCT法による裏面き裂の同定(OS09-1 逆問題解析手法の開発と最新応用(1))(OS09 逆問題解析手法の開発と最新応用)
塩沢 大輝久保 司郎阪上 隆英
著者情報
会議録・要旨集 フリー

詳細
抄録
When the piezoelectric film is glued on the surface of a cracked material subjected to mechanical load, change in distribution of electric potential is observed on the surface of piezoelectric film. Based on this phenomenon, passive electric potential CT(computed tomography) method was developed for the identification of two- and three-dimensional cracks based on the FEM inverse analysis. In this paper, this method was applied to identify 3-D surface crack opening on the back surface. Numerical simulations were carried out on determination of location and size of back surface crack. It was found that crack parameters were identified within the error of 1.0%, when the noise level of observed electric potential distribution was lower than 0.1%.
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© 2001 一般社団法人 日本機械学会
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