The Proceedings of The Computational Mechanics Conference
Online ISSN : 2424-2799
2010.23
Session ID : 1714
Conference information
1714 Device Simulation of Electrical Characteristics on nMOSFETs Under Uniaxial Stress
Masaaki KOGANEMARU, Keisuke YOSHIDA, Toru IKEDA, Noriyuki MIYAZAKI, Hajime TOMOKAGE
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Keywords: device simulation, uniaxial stress, nMOSFET, electron mobility, electron effective mass
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© 2010 The Japan Society of Mechanical Engineers
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