The Proceedings of the Dynamics & Design Conference
Online ISSN : 2424-2993
2006
Session ID : 104
Conference information
104 The Development of Atomic Force Microscopy (AFM) Using a "Van der Pol" Type Self-excitation for Prove-Cantilever : 3rd Report: A prototype AFM using optical lever method
Keiichi HAYASHIKiwamu ASHIDAMasaharu KURODAHiroshi YABUNO
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
There have been researches on a self-excited cantilever beam for atomic force microscopy (AFM), in order to increase the low quality factor Q of the cantilever in liquid enviroments. For the realization of the non-contact AFM, it is necessary to control the stable steady state amplitude of the self-excited cantilever to be small. We proposed that we can realize the stable steady state amplitude of of the self-excited cantilever by applying nonlinear feedback proportional to the squared deflection and the velocity. In this study, we develop the AFM using a "van der Pol" type self-excited cantilever beam. Then, we confirm the availability and the advantage of the "van der Pol" type self-excited cantilever beam.
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© 2006 The Japan Society of Mechanical Engineers
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