The Proceedings of Ibaraki District Conference
Online ISSN : 2424-2683
ISSN-L : 2424-2683
2002
Conference information
Thermo-viscoelastic Analysis of Thermal Residual Stress Influenced by Layer Construction in Electronic Devices
Yoshiyuki Kushizaki, Masahiko Goto, Shozo Nakamura
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Keywords: Viscoelastic Analysis, Thermal Residual Stress, Residual Warp Deformation Semiconductor Device, Layer Construction, Plastic Composites
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Pages 93-94

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© 2002 The Japan Society of Mechanical Engineers
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