The Proceedings of the Conference on Information, Intelligence and Precision Equipment : IIP
Online ISSN : 2424-3140
2007
Session ID : 1111
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1111 High aspect ratio shape forming technology using Si crystal anisotropy etching
Shinya NAGAOFumikazu OOHIRAMaho HOSOGIGen HASHIGUCHI
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
Recently, high aspect ratio structure forming is important technology to apply for the sensing device and micro pillar array structure. In a general way, a dry etching process using ICP-RIE (inductively-coupled plasma-reactive ion etching) is well known to fabricate the high aspect ratio structure. However, using Deep RIE generates the scalloping of the sidewall. This paper proposes the high aspect ratio shape forming technology using Si crystal anisotropic etching. In this method, we fabricate the high aspect ratio micro pillar array using (110) Si crystal by TMAH wet etching. As a result, we confirmed the principle for the high aspect ratio structure forming only by using a wet etching process, our proposed method has features of lower cost than ICP-RIE and good surface roughness.
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© 2007 The Japan Society of Mechanical Engineers
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