主催: 一般社団法人 日本機械学会
会議名: IIP2017 情報・知能・精密機器部門講演会
開催日: 2017/03/14 - 2017/03/15
Surface forces interacting between solids play an important role for small devices such as micro/nanoelectromechanical systems (MEMS/NEMS) or for industrial processes including tribological phenomena. Atomic force microscope (AFM) and surface force apparatus (SFA) are often used to measure the surface forces with ultra-high resolution. In this study, we proposed a new method of surface force measurements using the quartz crystal microbalance (QCM). Combining the surface interaction force tester and the QCM, the surface interaction forces and resonant frequency shift of the QCM were measured simultaneously. The basic characteristics of the relationships between the surface forces and the frequency shifts were obtained using the newly developed experimental system.